{"id":31,"count":1,"description":"","link":"https:\/\/wsfsocket.com\/zh\/product-category\/ic-test-sockets\/sop-tsop-series\/","name":"SOP\/TSOP Series","slug":"sop-tsop-series","taxonomy":"product_cat","parent":29,"meta":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v23.8 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>SOP\/TSOP Series\u5f52\u6863 - WSF IC Test Solution<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/wsfsocket.com\/zh\/product-category\/ic-test-sockets\/sop-tsop-series\/\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"SOP\/TSOP Series\u5f52\u6863 - WSF IC Test Solution\" \/>\n<meta property=\"og:url\" content=\"https:\/\/wsfsocket.com\/zh\/product-category\/ic-test-sockets\/sop-tsop-series\/\" \/>\n<meta property=\"og:site_name\" content=\"WSF IC Test Solution\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"CollectionPage\",\"@id\":\"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/\",\"url\":\"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/\",\"name\":\"SOP\/TSOP Series\u5f52\u6863 - WSF IC Test Solution\",\"isPartOf\":{\"@id\":\"https:\/\/wsfsocket.com\/#website\"},\"breadcrumb\":{\"@id\":\"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/#breadcrumb\"},\"inLanguage\":\"zh-Hans\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/wsfsocket.com\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"IC Test Sockets\",\"item\":\"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"SOP\/TSOP Series\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/wsfsocket.com\/#website\",\"url\":\"https:\/\/wsfsocket.com\/\",\"name\":\"WSF IC Test Solution\",\"description\":\"WSF Test Fixture, Test and Burn-in Sockets for Semiconductors and Electronics\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/wsfsocket.com\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"zh-Hans\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"SOP\/TSOP Series\u5f52\u6863 - WSF IC Test Solution","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/wsfsocket.com\/zh\/product-category\/ic-test-sockets\/sop-tsop-series\/","og_locale":"zh_CN","og_type":"article","og_title":"SOP\/TSOP Series\u5f52\u6863 - WSF IC Test Solution","og_url":"https:\/\/wsfsocket.com\/zh\/product-category\/ic-test-sockets\/sop-tsop-series\/","og_site_name":"WSF IC Test Solution","twitter_card":"summary_large_image","schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"CollectionPage","@id":"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/","url":"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/","name":"SOP\/TSOP Series\u5f52\u6863 - WSF IC Test Solution","isPartOf":{"@id":"https:\/\/wsfsocket.com\/#website"},"breadcrumb":{"@id":"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/#breadcrumb"},"inLanguage":"zh-Hans"},{"@type":"BreadcrumbList","@id":"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/sop-tsop-series\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/wsfsocket.com\/"},{"@type":"ListItem","position":2,"name":"IC Test Sockets","item":"https:\/\/wsfsocket.com\/product-category\/ic-test-sockets\/"},{"@type":"ListItem","position":3,"name":"SOP\/TSOP Series"}]},{"@type":"WebSite","@id":"https:\/\/wsfsocket.com\/#website","url":"https:\/\/wsfsocket.com\/","name":"WSF IC Test Solution","description":"WSF Test Fixture, Test and Burn-in Sockets for Semiconductors and Electronics","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/wsfsocket.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"zh-Hans"}]}},"_links":{"self":[{"href":"https:\/\/wsfsocket.com\/zh\/wp-json\/wp\/v2\/product_cat\/31","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/wsfsocket.com\/zh\/wp-json\/wp\/v2\/product_cat"}],"about":[{"href":"https:\/\/wsfsocket.com\/zh\/wp-json\/wp\/v2\/taxonomies\/product_cat"}],"up":[{"embeddable":true,"href":"https:\/\/wsfsocket.com\/zh\/wp-json\/wp\/v2\/product_cat\/29"}],"wp:post_type":[{"href":"https:\/\/wsfsocket.com\/zh\/wp-json\/wp\/v2\/product?product_cat=31"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}